Elphos laboratories have been developed integrating the modern ultrafast laser sources with angle-resolved photoemission experiments and with the traditional optical spectroscopic techniques. We are currently able to investigate the non-equilibrium electron dynamics in solid-state systems through time-resolved photoemission and to perform high resolution time-and-frequency resolved optical spectroscopies to study the ultrafast electron dynamics in high-Tc superconductors and strongly correlated systems.
Our facilities...
|
PHOTOEMISSION
|
-
UHV chamber equipped with:
° 5 degrees of freedom cryogenic sample holder (minimum temperature: 30 K)
° Time of Flight spectrometer (en. resolution: 15 meV@ 2 eV kin. en.)
° Low Energy Electron Diffraction
° Ion-gun for sample preparation
° Preparation chamber for sample evaporation
-
UHV chamber equipped with:
° Hemispherical electron analyzer
° Preparation chamber for sample evaporation
° Electromagnets for magneto-optical measurements
|
|
|
 |
 |
|
|
OPTICS
|
-
Amplified Ti:sapphire oscillator
° 800 nm wavelength
° 150 fs pulse duration
° 1 kHz rep. rate, 1 W output power
-
Collinear optical parametric amplifier
of super-fluorescence
° 1250-2200 nm wavelength tunability
° 150 fs pulse duration
-
Non-collinear optical parametric amplifier
of white-light continuum
° 425-750 nm wavelength tunability
° 30 fs pulse duration
-
Cavity dumped Ti:sapphire oscillator
° 700-950 nm wavelength tunability
° 120 fs pulse duration
° Rep. rate tunable from 1.8 MHz to single shot
° 60 nJ/pulse energy
-
White-light continuum generation through photonic fiber
° 450-1600 nm wavelength tunability
° pulse characterization
° high-speed array detection for simultaneous time-and-frequency resolution
-
Optical spectrum analyzer
° 350-1750 nm wavelength range
° 0.05 nm maximum resolution
° -75-20 dBm measurement level range
|
|
|
OTHER EQUIPMENTS
|
-
Time-resolved magneto-optics
° Double lock-in configuration
° 50 kHz Photoelastic modulator
-
Electromagnet
° 1.2 T maximum magnetic field
Cryogenic sample holder
° 4.5 K minimum temperature
° Reflectivity and transmissivity measurement configurations
|
|
|
 |
|
|
|
MICROSCOPY
|
-
Atomic Force Microscopy
° 1 AFM microscope operating in the frequency modulation mode (FM-AFM)
° 1 AFM microscope operating in the amplitude modulation mode (AM-AFM).
-
Scanning-probe Near-field Optical Microscopy
° 1 SNOM, working simultaneously in collection mode, reflection mode and transmission mode.
|
|