Università Cattolica del Sacro Cuore – Sede di Brescia

Dipartimento di Matematica e Fisica

“Niccolò Tartaglia”

Via dei Musei, 41 - Brescia

Investigation of nanoscale interfacial properties

of thin films by

Atomic Force Microscopy

venerdì 4 novembre 2011, ore 11.30,

Sala Riunioni

relatore

Dr. Alessandro Podestà

Università degli Studi di Milano

ABSTRACT

The understanding of interfacial phenomena in thin films and nanostructures requires dedicated experimental approaches and techniques, which allow to quantitatively characterize morphological and other chemico-physical properties with nanoscale spatial resolution.

During the seminar, Atomic Force Microscopy (AFM) and related techniques will be introduced as powerful tools for the investigation of nanoscale interfacial properties, in particular for the investigation of the wettability and of the local electric properties of nanostructured thin films.